Teseq NSG 5071 Inductive Switch Transient Test Circuit

Teseq NSG 5071 Inductive Switch Transient Test Circuit is designed exactly in accordance with EMC-CS-2009.1 for test CI 220 pulses A1, A2-1, A2-2, C1, C2 and RI 130 using an inductive/relay transient generator test circuit. The NSG 5071 also features the CI 260 Waveform F in this test circuit which uses the same type of relay. This test circuit is defined in annex F for the A, C pulses and RI 130 and figure 19-10 for CI 260 Waveform F.